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Volume 79
Main
Microelectronics Reliability
Volume 79
Microelectronics Reliability
Volume 79
1
Effect of oxygen vacancy in tungsten oxide on the photocatalytic activity for decomposition of organic materials in the gas phase
Fukushi, Daisuke
,
Sasaki, Akito
,
Hirabayashi, Hideaki
,
Kitano, Masaaki
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 270 KB
Your tags:
english, 2017
2
Solder joint fatigue life prediction using peridynamic approach
Baber, Forrest
,
Guven, Ibrahim
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.82 MB
Your tags:
english, 2017
3
Growth competition between layer-type and porous-type Cu 3 Sn in microbumps
Chu, David T.
,
Chu, Yi-Cheng
,
Lin, Jie-An
,
Chen, Yi-Ting
,
Wang, Chun-Chieh
,
Song, Yen-Fang
,
Chiang, Cheng-Cheng
,
Chen, Chih
,
Tu, K.N.
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.25 MB
Your tags:
english, 2017
4
Thermo-mechanical reliability analysis of a RF SiP module based on LTCC substrate
Chen, Cheng
,
Hou, Fengze
,
Liu, Fengman
,
She, Qian
,
Cao, Liqiang
,
Wan, Lixi
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 4.06 MB
Your tags:
english, 2017
5
Trend of the development of metal-based heat dissipative materials
Mizuuchi, Kiyoshi
,
Inoue, Kanryu
,
Agari, Yasuyuki
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 2.97 MB
Your tags:
english, 2017
6
Numerical simulation of self-alignment of chip resistor components for different silver content during reflow soldering
Najib, A.M.
,
Abdullah, M.Z.
,
Saad, A.A.
,
Samsudin, Z.
,
Che Ani, F.
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.20 MB
Your tags:
english, 2017
7
BTI mitigation by anti-ageing software patterns
Abbas, Haider Muhi
,
Halak, Basel
,
Zwolinski, Mark
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.61 MB
Your tags:
english, 2017
8
Stress imaging in structural challenging MEMS with high sensitivity using micro-Raman spectroscopy
Meszmer, Peter
,
Rodriguez, Raul D.
,
Sheremet, Evgeniya
,
Zahn, Dietrich R.T.
,
Wunderle, Bernhard
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.14 MB
Your tags:
english, 2017
9
Comparative studies on microelectronic reliability issue of Sn whisker growth in Sn-0.3Ag-0.7Cu-1Pr solder under different environments
Wu, Jie
,
Xue, Songbai
,
Wang, Jingwen
,
Wang, Jianxin
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 5.41 MB
Your tags:
english, 2017
10
Nucleation and shrinkage of defects on the surface of tin induced by local strain distribution
Shibutani, Tadahiro
,
Sun, Jing Wen
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 919 KB
Your tags:
english, 2017
11
Direct observation of changes in the effective minority-carrier lifetime of SiN x -passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests
Nishikawa, Naoyuki
,
Yamaguchi, Seira
,
Ohdaira, Keisuke
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 543 KB
Your tags:
english, 2017
12
Effects of nooks configuration on hydrothermal performance of zigzag channels for nanofluid-cooled microelectronic heat sink
Khoshvaght-Aliabadi, M.
,
Hassani, S.M.
,
Mazloumi, S.H.
,
Nekoei, M.
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 2.58 MB
Your tags:
english, 2017
13
Modelling the temperature influence on dc characteristics of the IGBT
Górecki, Paweł
,
Górecki, Krzysztof
,
Zarębski, Janusz
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 868 KB
Your tags:
english, 2017
14
Cycle life estimation of lithium-ion polymer batteries using artificial neural network and support vector machine with time-resolved thermography
Zhou, Xunfei
,
Hsieh, Sheng-Jen
,
Peng, Bo
,
Hsieh, Daniel
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2017
15
Analysis of deep level defects in bipolar junction transistors irradiated by 2 MeV electrons
Ma, Yao
,
Xu, Pengfei
,
Guan, Mingyue
,
Boi, Filippo
,
Bo, Gao
,
Gong, Min
,
Wu, Xue
,
Wang, Yuxin
,
Wang, Hua
,
Niao, ZengQiang
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 719 KB
Your tags:
english, 2017
16
The phenomenon of tin pest: A review
Cornelius, Ben
,
Treivish, Shay
,
Rosenthal, Yair
,
Pecht, Michael
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 2.42 MB
Your tags:
english, 2017
17
Harmonic distortion analysis of triple gate SOI nanowire MOSFETS down to 100 K
Paz, B.C.
,
Doria, R.T.
,
Cassé, M.
,
Barraud, S.
,
Reimbold, G.
,
Vinet, M.
,
Faynot, O.
,
Pavanello, M.A.
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.75 MB
Your tags:
english, 2017
18
Using scanning acoustic microscopy and LM-BP algorithm for defect inspection of micro solder bumps
Liu, Fan
,
Su, Lei
,
Fan, Mengying
,
Yin, Jian
,
He, Zhenzhi
,
Lu, Xiangning
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 2.70 MB
Your tags:
english, 2017
19
Comparing the degradation effect of a ‘two-cell’ Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests
Ahmad Abubakar, Hadiza
,
Isa, Dino
,
Wan, Wong Yee
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.87 MB
Your tags:
english, 2017
20
Reliability of MEMS shallow arches based actuator under the combined effect of mechanical shock and electric loads
Ouakad, Hassen M.
,
AlQasimi, Jihad E.
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 928 KB
Your tags:
english, 2017
21
Investigation on X-ray irradiation on nanoscale nitride based charge trapping flash memory devices
Lee, Meng Chuan
,
Wong, Hin Yong
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 1.97 MB
Your tags:
english, 2017
22
Improved reliability characteristics of Ge MOS devices by capping Hf or Zr on interfacial layer
Li, Yan-Lin
,
Chang-Liao, Kuei-Shu
,
Chang, Yu-Wei
,
Huang, Tse-Jung
,
Li, Chen-Chien
,
Gu, Zhao-Chen
,
Chen, Po-Yen
,
Wu, Tzung-Yu
,
Huang, Jiayi
,
Chu, Fu-Chuan
,
Yi, Shih-Han
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 810 KB
Your tags:
english, 2017
23
Inside Front Cover - Editorial Board Page
Journal:
Microelectronics Reliability
Year:
2017
Language:
english
File:
PDF, 42 KB
Your tags:
english, 2017
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