Material interface detection based on secondary electron...

Ultramicroscopy 2018 / 01 Vol. 184

Material interface detection based on secondary electron images for focused ion beam machining

Joe, Hang-Eun, Lee, Won-Sup, Jun, Martin B. G., Park, No-Cheol, Min, Byung-Kwon
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Volume:
184
Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2017.10.012
Date:
January, 2018
File:
PDF, 1.81 MB
english, 2018
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