Volume 184

Ultramicroscopy

Volume 184

1

High-efficiency detector of secondary and backscattered electrons for low-dose imaging in the ESEM

Neděla, Vilém, Tihlaříková, Eva, Runštuk, Jiří, Hudec, Jiří

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.33 MB

english, 2018

2

Characterization of trapped charges distribution in terms of mirror plot curve

Al-Obaidi, Hassan N., Mahdi, Ali S., Khaleel, Imad H.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 673 KB

english, 2018

3

Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy

Xu, W., Dycus, J.H., LeBeau, J.M.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 3.04 MB

english, 2018

4

A menu of electron probes for optimising information from scanning transmission electron microscopy

Nguyen, D.T., Findlay, S.D., Etheridge, J.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 3.96 MB

english, 2018

5

Picometer-scale atom position analysis in annular bright-field STEM imaging

Gao, Peng, Kumamoto, Akihito, Ishikawa, Ryo, Lugg, Nathan, Shibata, Naoya, Ikuhara, Yuichi

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.57 MB

english, 2018

6

Mapping buried nanostructures using subsurface ultrasonic resonance force microscopy

van Es, Maarten H., Mohtashami, Abbas, Thijssen, Rutger M.T., Piras, Daniele, van Neer, Paul L.M.J., Sadeghian, Hamed

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 5.65 MB

english, 2018

7

Analytical modeling of electron energy loss spectroscopy of graphene: Ab initio study versus extended hydrodynamic model

Djordjević, Tijana, Radović, Ivan, Despoja, Vito, Lyon, Keenan, Borka, Duško, Mišković, Zoran L.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 946 KB

english, 2018

8

Atomic-scale structure relaxation, chemistry and charge distribution of dislocation cores in SrTiO 3

Gao, Peng, Ishikawa, Ryo, Feng, Bin, Kumamoto, Akihito, Shibata, Naoya, Ikuhara, Yuichi

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.37 MB

english, 2018

9

Optimization of digital image processing to determine quantum dots’ height and density from atomic force microscopy

Ruiz, J.E., Paciornik, S., Pinto, L.D., Ptak, F., Pires, M.P., Souza, P.L.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 3.53 MB

english, 2018

10

Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses

Baik, Sung-Il, Isheim, Dieter, Seidman, David N.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.20 MB

english, 2018

11

Contact atomic force microscopy using piezoresistive cantilevers in load force modulation mode

Biczysko, P., Dzierka, A., Jóźwiak, G., Rudek, M., Gotszalk, T., Janus, P., Grabiec, P., Rangelow, I.W.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 3.17 MB

english, 2018

12

Material interface detection based on secondary electron images for focused ion beam machining

Joe, Hang-Eun, Lee, Won-Sup, Jun, Martin B. G., Park, No-Cheol, Min, Byung-Kwon

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.81 MB

english, 2018

13

Si amorphization by focused ion beam milling: Point defect model with dynamic BCA simulation and experimental validation

Huang, J., Loeffler, M., Muehle, U., Moeller, W., Mulders, J.J.L., Kwakman, L.F.Tz., Van Dorp, W.F., Zschech, E.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.36 MB

english, 2018

14

Towards atomically resolved EELS elemental and fine structure mapping via multi-frame and energy-offset correction spectroscopy

Wang, Yi, Huang, Michael R. S., Salzberger, Ute, Hahn, Kersten, Sigle, Wilfried, van Aken, Peter A.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.07 MB

english, 2018

15

Quantitative HAADF STEM of SiGe in presence of amorphous surface layers from FIB preparation

Grieb, Tim, Tewes, Moritz, Schowalter, Marco, Müller-Caspary, Knut, Krause, Florian F., Mehrtens, Thorsten, Hartmann, Jean-Michel, Rosenauer, Andreas

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 2.76 MB

english, 2018

16

Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy

Weppelman, I.G.C., Moerland, R.J., Hoogenboom, J.P., Kruit, P.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.62 MB

english, 2018

17

Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM 110 mode for ultrafast electron microscopy

van Rens, J.F.M., Verhoeven, W., Franssen, J.G.H., Lassise, A.C., Stragier, X.F.D., Kieft, E.R., Mutsaers, P.H.A., Luiten, O.J.

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.50 MB

english, 2018

18

A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy

Ming, Wenquan, Chen, Jianghua, Allen, Christopher S., Duan, Shiyun, Shen, Ruohan

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.36 MB

english, 2018

19

Automatic correction of nonlinear damping effects in HAADF–STEM tomography for nanomaterials of discrete compositions

Zhong, Zhichao, Aveyard, Richard, Rieger, Bernd, Bals, Sara, Palenstijn, Willem Jan, Batenburg, K. Joost

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 2.43 MB

english, 2018

20

Novel simulation method of space charge effects in electron optical systems including emission of electrons

Zelinka, Jiří, Oral, Martin, Radlička, Tomáš

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 4.33 MB

english, 2018

21

Reduced electron exposure for energy-dispersive spectroscopy using dynamic sampling

Zhang, Yan, Godaliyadda, G. M. Dilshan, Ferrier, Nicola, Gulsoy, Emine B., Bouman, Charles A., Phatak, Charudatta

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 2.49 MB

english, 2018

22

Editorial Board

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 109 KB

english, 2018

23

Automated approaches for band gap mapping in STEM-EELS

Granerød, Cecilie S., Zhan, Wei, Prytz, Øystein

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 1.31 MB

english, 2018

24

Stereo-vision three-dimensional reconstruction of curvilinear structures imaged with a TEM

Oveisi, Emad, Letouzey, Antoine, De Zanet, Sandro, Lucas, Guillaume, Cantoni, Marco, Fua, Pascal, Hébert, Cécile

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 2.92 MB

english, 2018

25

Editorial Board

Journal:

Ultramicroscopy

Year:

2018

File:

PDF, 41 KB

2018

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