Adaptive accelerated aging for 28 nm HKMG technology
Patra, Devyani, Reza, Ahmed Kamal, Hassan, Mohammed Khaled, Katoozi, Mehdi, Cannon, Ethan H., Roy, Kaushik, Cao, YuVolume:
80
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.002
Date:
January, 2018
File:
PDF, 987 KB
english, 2018