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Volume 80
Main
Microelectronics Reliability
Volume 80
Microelectronics Reliability
Volume 80
1
High temperature storage reliability of palladium coated copper wire in different EFO current settings
Cheng, Pi-Ying
,
Lai, Po-Ying
,
Ye, Jiun-Ming
,
Chen, Tsung-Chia
,
Hsieh, Cheng-Li
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.19 MB
Your tags:
english, 2018
2
Heat and mass transfer effects of laser soldering on growth behavior of interfacial intermetallic compounds in Sn/Cu and Sn-3.5Ag0.5/Cu joints
Kunwar, Anil
,
Shang, Shengyan
,
Råback, Peter
,
Wang, Yunpeng
,
Givernaud, Julien
,
Chen, Jun
,
Ma, Haitao
,
Song, Xueguan
,
Zhao, Ning
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 3.46 MB
Your tags:
english, 2018
3
Microstructures and properties of Bi 10Ag high temperature solder doped with Cu element
Yin, Limeng
,
Li, Dong
,
Yao, Zongxiang
,
Wang, Gang
,
Blackburn, Adrian
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.44 MB
Your tags:
english, 2018
4
Threshold voltage peculiarities and bias temperature instabilities of SiC MOSFETs
Aichinger, Thomas
,
Rescher, Gerald
,
Pobegen, Gregor
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.68 MB
Your tags:
english, 2018
5
Study of proton radiation effect to row hammer fault in DDR4 SDRAMs
Lim, Chulseung
,
Park, Kyungbae
,
Bak, Geunyong
,
Yun, Donghyuk
,
Park, Myungsang
,
Baeg, Sanghyeon
,
Wen, Shi-Jie
,
Wong, Richard
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 865 KB
Your tags:
english, 2018
6
Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors
Garros, Xavier
,
Laurent, Antoine
,
Subirats, Alexandre
,
Federspiel, X.
,
Vincent, E.
,
Reimbold, Gilles
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 2.74 MB
Your tags:
english, 2018
7
Constitutive modelling on the whole-life uniaxial ratcheting behavior of sintered nano-scale silver paste at room and high temperatures
Chen, Gang
,
Zhao, Xiaochen
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.04 MB
Your tags:
english, 2018
8
As-grown-generation (AG) model of NBTI: A shift from fitting test data to prediction
Zhang, J.F.
,
Ji, Z.
,
Zhang, W.
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 3.95 MB
Your tags:
english, 2018
9
Refined metastability characterization using a time-to-digital converter
Polzer, Thomas
,
Huemer, Florian
,
Steininger, Andreas
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 872 KB
Your tags:
english, 2018
10
Design for Small Delay Test - A Simulation Study
Kampmann, Matthias
,
Hellebrand, Sybille
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.85 MB
Your tags:
english, 2018
11
Experimental study on the influence of junction temperature on the relationship between IGBT switching energy loss and device current
Das, Subhas Chandra
,
Narayanan, G.
,
Tiwari, Arvind
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 942 KB
Your tags:
english, 2018
12
Modulation method for measuring thermal impedance components of semiconductor devices
Smirnov, V.I.
,
Sergeev, V.A.
,
Gavrikov, A.A.
,
Shorin, A.M.
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.74 MB
Your tags:
english, 2018
13
Design for reliability of generic sensor interface circuits
Heinssen, Sascha
,
Hillebrand, Theodor
,
Taddiken, Maike
,
Tscherkaschin, Konstantin
,
Paul, Steffen
,
Peters-Drolshagen, Dagmar
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 2.48 MB
Your tags:
english, 2018
14
Compact modeling of dynamic trap density evolution for predicting circuit-performance aging
Miura-Mattausch, M.
,
Miyamoto, H.
,
Kikuchihara, H.
,
Maiti, T.K.
,
Rohbani, N.
,
Navarro, D.
,
Mattausch, H.J.
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.93 MB
Your tags:
english, 2018
15
Experimental analysis of Sn-3.0Ag-0.5Cu solder joint board-level drop/vibration impact failure models after thermal/isothermal cycling
Gu, Jian
,
Lin, Jian
,
Lei, Yongping
,
Fu, Hanguang
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 3.31 MB
Your tags:
english, 2018
16
The dominant effect of c -axis orientation in tin on the electromigration behaviors in tricrystal Sn-3.0Ag-0.5Cu solder joints
Tian, Yu
,
Han, Jing
,
Ma, Limin
,
Guo, Fu
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.14 MB
Your tags:
english, 2018
17
Warpage simulation for the reconstituted wafer used in fan-out wafer level packaging
Chiu, Tz-Cheng
,
Yeh, En-Yu
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.54 MB
Your tags:
english, 2018
18
Microstructure evolution and mechanical strength evaluation in Ag/Sn/Cu TLP bonding interconnection during aging test
Guo, Qiang
,
Sun, Siyu
,
Zhang, Zhihao
,
Chen, Hongtao
,
Li, Mingyu
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 960 KB
Your tags:
english, 2018
19
Solderless bonding with nanoporous copper as interlayer for high-temperature applications
Sun, Siyu
,
Guo, Qiang
,
Chen, Hongtao
,
Li, Mingyu
,
Wang, Chunqing
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.66 MB
Your tags:
english, 2018
20
Reliability and failure analysis of SAC 105 and SAC 1205N lead-free solder alloys during drop test events
Wu, Mei-Ling
,
Lan, Jia-Shen
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.90 MB
Your tags:
english, 2018
21
Estimating dynamic power consumption for memristor-based CiM architecture
Traiola, Marcello
,
Barbareschi, Mario
,
Bosio, Alberto
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 853 KB
Your tags:
english, 2018
22
Investigating the impact of the defect dynamic characteristics on the PBTI in the high- κ gate device
Liu, Xianqiang
,
Xu, Xiaodi
,
Gu, Chenjie
,
Gu, Renyuan
,
Wang, Weiwei
,
Liu, Wenjun
,
Duan, Tianli
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 682 KB
Your tags:
english, 2018
23
Ultra-low-voltage boosted driver for self-powered systems
Šovčík, Michal
,
Kováč, Martin
,
Arbet, Daniel
,
Stopjaková, Viera
,
Potočný, Miroslav
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 2.69 MB
Your tags:
english, 2018
24
Experimental and modeling study on viscosity of encapsulant for electronic packaging
Shan, Xiuyang
,
Chen, Yun
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 700 KB
Your tags:
english, 2018
25
VDMOSFET HEF degradation modelling considering turn-around phenomenon
Ye, X.R.
,
Chen, C.
,
Wang, Y.X.
,
Wang, L.
,
Zhai, G.F.
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 903 KB
Your tags:
english, 2018
26
Handling of transient and permanent faults in dynamically scheduled super-scalar processors
Mühlbauer, Felix
,
Schröder, Lukas
,
Schölzel, Mario
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 720 KB
Your tags:
english, 2018
27
Adaptive accelerated aging for 28 nm HKMG technology
Patra, Devyani
,
Reza, Ahmed Kamal
,
Hassan, Mohammed Khaled
,
Katoozi, Mehdi
,
Cannon, Ethan H.
,
Roy, Kaushik
,
Cao, Yu
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 987 KB
Your tags:
english, 2018
28
Non-linear thermal simulation at system level: Compact modelling and experimental validation
Bernardoni, Mirko
,
Delmonte, Nicola
,
Chiozzi, Diego
,
Cova, Paolo
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.32 MB
Your tags:
english, 2018
29
Embedding a feedforward controller into the IGBT gate driver for turn-on transient improvement
Ghorbani, Hamidreza
,
Caselles, Vicent Sala
,
Camacho, Alejandro Parades
,
Martinez, Jose Luis Romeral
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 1.88 MB
Your tags:
english, 2018
30
Editorial Board
Journal:
Microelectronics Reliability
Year:
2018
Language:
english
File:
PDF, 37 KB
Your tags:
english, 2018
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