Non-linear thermal simulation at system level: Compact...

Microelectronics Reliability 2018 / 01 Vol. 80

Non-linear thermal simulation at system level: Compact modelling and experimental validation

Bernardoni, Mirko, Delmonte, Nicola, Chiozzi, Diego, Cova, Paolo
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Volume:
80
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.005
Date:
January, 2018
File:
PDF, 1.32 MB
english, 2018
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