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NBTI: Experimental investigation, physical modelling, circuit aging simulations and verification
Schlünder, C., Puschkarsky, K., Rott, G.A., Gustin, W., Reisinger, H.Volume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.043
Date:
March, 2018
File:
PDF, 2.01 MB
english, 2018