Effect of Stress on the Dielectric Constant of Alumina

Effect of Stress on the Dielectric Constant of Alumina

Wen, Sihai, Chung, D. D. L.
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Volume:
127
Year:
2005
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.1939029
File:
PDF, 73 KB
english, 2005
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