Thermal lifetime estimation method of IGBT module...

Microelectronics Reliability 2018 / 03 Vol. 82

Thermal lifetime estimation method of IGBT module considering solder fatigue damage feedback loop

Gao, Bing, Yang, Fan, Chen, Minyou, Chen, Yigao, Lai, Wei, Liu, Chao
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Volume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.046
Date:
March, 2018
File:
PDF, 1.32 MB
english, 2018
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