60 Co gamma radiation total ionizing dose combined with...

Microelectronics Reliability 2018 / 03 Vol. 82

60 Co gamma radiation total ionizing dose combined with conducted electromagnetic interference studies in BJTs

Lawal, Olarewaju Mubashiru, Liu, Shuhuan, Li, Zhuoqi, Hussain, Aqil
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Volume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.01.020
Date:
March, 2018
File:
PDF, 687 KB
english, 2018
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