STEM moiré analysis for 2D strain measurements
Ishizuka, Akimitsu, Hytch, Martin, Ishizuka, KazuoVolume:
66
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfx009
Date:
June, 2017
File:
PDF, 281 KB
english, 2017