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STEM moiré analysis for 2D strain measurements

STEM moiré analysis for 2D strain measurements

Ishizuka, Akimitsu, Hytch, Martin, Ishizuka, Kazuo
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Volume:
66
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfx009
Date:
June, 2017
File:
PDF, 281 KB
english, 2017
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