Volume 66; Issue 3

Journal of Electron Microscopy

Volume 66; Issue 3
2

STEM moiré analysis for 2D strain measurements

Year:
2017
Language:
english
File:
PDF, 281 KB
english, 2017
4

Optimization of STEM imaging conditions for cryo-tomography

Year:
2017
Language:
english
File:
PDF, 902 KB
english, 2017
9

Development toward high-resolution X-ray phase imaging

Year:
2017
Language:
english
File:
PDF, 1.04 MB
english, 2017
10

Microscopy in this issue

Year:
2017
Language:
english
File:
PDF, 498 KB
english, 2017