Review of bias-temperature instabilities at the...

Microelectronics Reliability 2018 / 03 Vol. 82

Review of bias-temperature instabilities at the III-N/dielectric interface

Ostermaier, C., Lagger, P., Reiner, M., Pogany, D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.12.039
Date:
March, 2018
File:
PDF, 3.00 MB
english, 2018
Conversion to is in progress
Conversion to is failed