Localized Tunneling Phenomena of Nanometer Scaled High-...

IEEE Transactions on Electron Devices 2017 / 8 Vol. 64; Iss. 8

Localized Tunneling Phenomena of Nanometer Scaled High- ${K}$ Gate-Stack

Lin, Po-Jui Jerry, Lee, Che-An Andy, Yao, Chih-Wei Kira, Lin, Hsin-Jyun Vincent, Watanabe, Hiroshi
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2017.2713322
Date:
August, 2017
File:
PDF, 1.38 MB
english, 2017
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