Total Ionizing Dose Hardened and Mitigation Strategies in...

IEEE Transactions on Electron Devices 2018 / 3 Vol. 65; Iss. 3

Total Ionizing Dose Hardened and Mitigation Strategies in Deep Submicrometer CMOS and Beyond

Chatzikyriakou, Eleni, Morgan, Katrina, de Groot, C. H. Kees
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2792305
Date:
March, 2018
File:
PDF, 1.56 MB
english, 2018
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