Study of electrochemical migration based transport kinetics...

Microelectronics Reliability 2018 / 04 Vol. 83

Study of electrochemical migration based transport kinetics of metal ions in Sn-9Zn alloy

Ma, Haoran, Kunwar, Anil, Chen, Jun, Qu, Lin, Wang, Yunpeng, Song, Xueguan, Råback, Peter, Ma, Haitao, Zhao, Ning
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Volume:
83
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.02.013
Date:
April, 2018
File:
PDF, 2.07 MB
english, 2018
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