Study and analysis of DR-VCO for rad-hardness in type II...

Microelectronics Reliability 2018 / 03 Vol. 82

Study and analysis of DR-VCO for rad-hardness in type II third order CPLL

Karthigeyan, K.A., Chandramani, Premanand Venkatesh
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Volume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.01.018
Date:
March, 2018
File:
PDF, 1.48 MB
english, 2018
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