Simplification of sub-gap density of states extraction...

Microelectronics Reliability 2018 / 04 Vol. 83

Simplification of sub-gap density of states extraction method for amorphous In-Ga-Zn-O thin-film transistors by a single capacitance-voltage curve

Wang, Weiliang, Wang, Pengjun, Dai, Mingzhi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
83
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.01.007
Date:
April, 2018
File:
PDF, 588 KB
english, 2018
Conversion to is in progress
Conversion to is failed