A similarity based prognostics approach for real time...

Microelectronics Reliability 2018 / 04 Vol. 83

A similarity based prognostics approach for real time health management of electronics using impedance analysis and SVM regression

Lee, Changyong, Kwon, Daeil
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Volume:
83
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.02.014
Date:
April, 2018
File:
PDF, 1.16 MB
english, 2018
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