Non-destructive, high-content analysis of wheat grain...

Plant Methods 2017 / 12 Vol. 13; Iss. 1

Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography

Hughes, Nathan, Askew, Karen, Scotson, Callum P., Williams, Kevin, Sauze, Colin, Corke, Fiona, Doonan, John H., Nibau, Candida
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Volume:
13
Language:
english
Journal:
Plant Methods
DOI:
10.1186/s13007-017-0229-8
Date:
December, 2017
File:
PDF, 2.36 MB
english, 2017
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