An advanced SEU tolerant latch based on error detection

Journal of Semiconductors 2018 / 05 Vol. 39; Iss. 5

An advanced SEU tolerant latch based on error detection

Xu, Hui, Zhu, Jianwei, Lu, Xiaoping, Li, Jingzhao
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Volume:
39
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/39/5/055003
Date:
May, 2018
File:
PDF, 348 KB
english, 2018
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