Importance of test parameters, specimen type and use configuration on the identification of Sn/Ag solder behaviour laws
Martin, Carmen, Micol, Alexandre, Pérès, FrançoisVolume:
82
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.01.006
Date:
March, 2018
File:
PDF, 1.93 MB
english, 2018