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State-Transition-Aware Spilling Heuristic for MLC STT-RAM-Based Registers
Ni, Yuanhui, Gong, Zhiyao, Chen, Weiwen, Yang, Chengmo, Qiu, KeniVolume:
2017
Year:
2017
Language:
english
Journal:
VLSI Design
DOI:
10.1155/2017/1030249
File:
PDF, 1.41 MB
english, 2017