Reliability evaluation of logic circuits based on transient...

Reliability evaluation of logic circuits based on transient faults propagation metrics

Cai, Shuo, Yu, Fei, Wang, Weizheng, Liu, Tieqiao, Liu, Peng, Wang, Wei
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Volume:
14
Year:
2017
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.14.20170128
File:
PDF, 699 KB
english, 2017
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