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Reliability evaluation of logic circuits based on transient faults propagation metrics
Cai, Shuo, Yu, Fei, Wang, Weizheng, Liu, Tieqiao, Liu, Peng, Wang, WeiVolume:
14
Year:
2017
Language:
english
Journal:
IEICE Electronics Express
DOI:
10.1587/elex.14.20170128
File:
PDF, 699 KB
english, 2017