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Volume 14; Issue 7
Main
IEICE Electronics Express
Volume 14; Issue 7
IEICE Electronics Express
Volume 14; Issue 7
1
Reliability evaluation of logic circuits based on transient faults propagation metrics
Cai, Shuo
,
Yu, Fei
,
Wang, Weizheng
,
Liu, Tieqiao
,
Liu, Peng
,
Wang, Wei
Journal:
IEICE Electronics Express
Year:
2017
Language:
english
File:
PDF, 699 KB
Your tags:
english, 2017
2
VLSI implementation of the modified sign-error LMS adaptive algorithm
Liu, Ming
,
Wang, Mingjiang
,
Liu, De
,
Zhao, Boya
Journal:
IEICE Electronics Express
Year:
2017
Language:
english
File:
PDF, 545 KB
Your tags:
english, 2017
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