Oscillation-Based Test Applied to a Wideband CCII

VLSI Design 2017 Vol. 2017

Oscillation-Based Test Applied to a Wideband CCII

Petrashin, Pablo, Toledo, Luis, Lancioni, Walter, Osuch, Piotr, Stander, Tinus
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Volume:
2017
Year:
2017
Language:
english
Journal:
VLSI Design
DOI:
10.1155/2017/5075103
File:
PDF, 1.64 MB
english, 2017
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