![](/img/cover-not-exists.png)
Surface Recombination Velocity Imaging of HF-Etched Si Wafers Using Dynamic Heterodyne Lock-In Carrierography
Sun, Qi Ming, Melnikov, Alexander, Mandelis, Andreas, Pagliaro, RobertVolume:
282
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.282.13
Date:
August, 2018
File:
PDF, 1.40 MB
english, 2018