Characterization of electron charging and transport...

Semiconductor Science and Technology 2018 / 12 Vol. 33; Iss. 12

Characterization of electron charging and transport properties of Si-QDs with phosphorus doped Ge core

Nagai, Ryo, Yamada, Kentaro, Fujimori, Shuntaro, Ikeda, Mitsuhisa, Makihara, Katsunori, Ohta, Akio, Miyazaki, Seiichi
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Volume:
33
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aaebbc
Date:
December, 2018
File:
PDF, 1.30 MB
english, 2018
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