Study on the destruction mechanism caused by dynamic...

Study on the destruction mechanism caused by dynamic avalanche in GCTs

Yang, Wuhua, Wang, Cailin, Yang, Jing
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Volume:
92
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.11.001
Date:
January, 2019
File:
PDF, 1.95 MB
english, 2019
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