Optimization of an Artificial Neural Network System for the...

Microelectronics Reliability 2019 / 01 Vol. 92

Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success

Zhao, Lin, Goh, S.H., Chan, Y.H., Yeoh, B.L., Hu, Hao, Thor, M.H., Tan, Alan, Lam, Jeffrey
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Volume:
92
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.11.014
Date:
January, 2019
File:
PDF, 2.53 MB
english, 2019
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