Resolving trapping effects by scanning microwave microscopy

Microelectronics Reliability 2019 / 01 Vol. 92

Resolving trapping effects by scanning microwave microscopy

Hommel, S., Killat, N., Schweinboeck, T., Altes, A., Kreupl, F.
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Volume:
92
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.11.018
Date:
January, 2019
File:
PDF, 1.38 MB
2019
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