Caution: Abnormal Variability Due to Terrestrial Cosmic...

IEEE Transactions on Electron Devices 2019 / 4 Vol. 66; Iss. 4

Caution: Abnormal Variability Due to Terrestrial Cosmic Rays in Scaled-Down FinFETs

Kim, Jungsik, Lee, Jeong-Soo, Han, Jin-Woo, Meyyappan, M.
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Volume:
66
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2899056
Date:
April, 2019
File:
PDF, 7 KB
2019
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