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An Ultralow Turn-Off Loss SOI-LIGBT With a High-Voltage p-i-n Diode Integrated on Field Oxide
Wu, Jiayu, Kong, Moufu, Yi, Bo, Chen, Xing BiVolume:
66
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2898232
Date:
April, 2019
File:
PDF, 2.20 MB
2019