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Experimental determination of critical adhesion energies with the Advanced Button Shear Test
Pflügler, Nadine, Reuther, Georg M., Goroll, Michael, Udiljak, Dominik, Pufall, Reinhard, Wunderle, BernhardVolume:
99
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.06.001
Date:
August, 2019
File:
PDF, 2.70 MB
english, 2019