Electrical Stability Analysis of Dynamic Logic Using...

IEEE Electron Device Letters 2019 / 7 Vol. 40; Iss. 7

Electrical Stability Analysis of Dynamic Logic Using Amorphous Indium–Gallium–Zinc-Oxide TFTs

Kim, Yong-Duck, Kim, Jong-Seok, Lee, Jong-Il, Han, Ki-Lim, Kim, Beom-Su, Park, Jin-Seong, Choi, Byong-Deok
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Volume:
40
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2019.2920634
Date:
July, 2019
File:
PDF, 1.06 MB
english, 2019
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