Discharge Current Analysis Estimating the Defect Sites in...

IEEE Transactions on Electron Devices 2018 / 8 Vol. 65; Iss. 8

Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

Goh, Youngin, Jeon, Sanghun
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Volume:
65
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2842193
Date:
August, 2018
File:
PDF, 908 KB
english, 2018
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