IEEE Transactions on Electron Devices

1

Nitrogen-Doped ZnO Film Fabricated Via Rapid Low-Temperature Atomic Layer Deposition for High-Performance ZnON Transistors

Ding, Xingwei, Yang, Jun, Qin, Cunping, Yang, Xuyong, Ding, Tao, Zhang, Jianhua

Journal:

Year:

2018

Language:

english

File:

PDF, 2.38 MB

english, 2018

2

Transient Performance Analysis and Optimization of Crossbar Memory Arrays Using NbO 2 -Based Threshold Switching Selectors

Pan, Chenyun, Naeemi, Azad

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.28 MB

english, 2018

3

Characterization of Buffer-Related Current Collapse by Buffer Potential Simulation in AlGaN/GaN HEMTs

Jia, Yonghao, Xu, Yuehang, Lu, Kai, Wen, Zhang, Huang, An-Dong, Guo, Yong-Xin

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 3.02 MB

english, 2018

4

Sharma, Pankaj, Dahshan, Alaa, Sehgal, Vivek Kumar, Aly, Kamal Abdel-Nabi

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.54 MB

english, 2018

5

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 85 KB

english, 2018

7

A Carrier Stored SOI LIGBT With Ultralow ON-State Voltage and High Current Capability

Sun, Tao, Luo, Xiaorong, Wei, Jie, Deng, Gaoqiang, Huang, Linhua, Zhao, Zheyan, Yang, Yang, Zhang, Bo, Li, Zhaoji, Cui, Wei, Yang, Yonghui, Zhu, Kunfeng

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.64 MB

english, 2018

8

Analysis, Design, and Optimization of the CHOPFET Magnetic Field Transducer

Osberger, Laurent, Frick, Vincent

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.61 MB

english, 2018

9

Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays—Part II: Random Telegraph Noise

Nicosia, Gianluca, Mannara, Aurelio, Resnati, Davide, Paolucci, Giovanni M., Tessariol, Paolo, Spinelli, Alessandro S., Lacaita, Andrea L., Goda, Akira, Monzio Compagnoni, Christian

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 3.74 MB

english, 2018

10

An Improved Hot-Carrier Lifetime Evaluation Method for the n-Type LDMOS With Hot-Hole Injection

Zhang, Chunwei, Li, Yang, Li, Zhiming, Fu, Xiaoqian, Chen, Zhenxiang

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 1.05 MB

english, 2018

11

Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

Goh, Youngin, Jeon, Sanghun

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 908 KB

english, 2018

12

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 75 KB

english, 2018

13

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Journal:

IEEE Transactions on Electron Devices

Year:

2018

File:

PDF, 1.33 MB

2018

14

Introducing IEEE Collabratec

Journal:

IEEE Transactions on Electron Devices

Year:

2018

File:

PDF, 2.01 MB

2018

15

Together, we are advancing technology

Journal:

IEEE Transactions on Electron Devices

Year:

2018

File:

PDF, 453 KB

2018

Volume 65; Issue 8

IEEE Transactions on Electron Devices

Nitrogen-Doped ZnO Film Fabricated Via Rapid Low-Temperature Atomic Layer Deposition for High-Performance ZnON Transistors

Transient Performance Analysis and Optimization of Crossbar Memory Arrays Using NbO 2 -Based Threshold Switching Selectors

Characterization of Buffer-Related Current Collapse by Buffer Potential Simulation in AlGaN/GaN HEMTs

Table of contents

IEEE Transactions on Electron Devices publication information

A Carrier Stored SOI LIGBT With Ultralow ON-State Voltage and High Current Capability

Analysis, Design, and Optimization of the CHOPFET Magnetic Field Transducer

Characterization and Modeling of Temperature Effects in 3-D NAND Flash Arrays—Part II: Random Telegraph Noise

An Improved Hot-Carrier Lifetime Evaluation Method for the n-Type LDMOS With Hot-Hole Injection

Discharge Current Analysis Estimating the Defect Sites in Amorphous Hafnia Thin-Film Transistor

IEEE Transactions on Electron Devices information for authors

Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Reliability of CMOS Logic, Memory, Power and Beyond CMOS Devices

Introducing IEEE Collabratec

Together, we are advancing technology