Yield analysis via induction of process statistics into the...

Yield analysis via induction of process statistics into the design of MEMS and other microsystems

Shyam Praveen Vudathu, Kishore Kumar Duganapalli, Rainer Laur, Dorota Kubalińska, Angelika Bunse-Gerstner
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Volume:
13
Language:
english
Pages:
7
DOI:
10.1007/s00542-006-0263-3
Date:
July, 2007
File:
PDF, 411 KB
english, 2007
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