Novel measurement and monitoring system for forming...

Microsystem Technologies 2010 / 05 Vol. 16; Iss. 5

Novel measurement and monitoring system for forming processes based on piezoresistive thin film systems

Saskia Biehl, Sebastian Staufenbiel, Frank Hauschild, André Albert
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Volume:
16
Language:
english
Pages:
5
DOI:
10.1007/s00542-010-1058-0
Date:
May, 2010
File:
PDF, 343 KB
english, 2010
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