A new high-voltage H2S single noxious gas reliability test for power modules
Wassermann, T.N., Schilling, O., Müller, K., Rossin, A., Uhlig, J.Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113468
Date:
September, 2019
File:
PDF, 1.75 MB
english, 2019