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Volume 100-101
Main
Microelectronics Reliability
Volume 100-101
Microelectronics Reliability
Volume 100-101
1
Radiation reliability benefit of area-optimized interleaved flip-flop layout in 28 nm technology
Jeon, Sang Hoon
,
Lim, C.
,
Baeg, S.
,
Wen, S.
,
Wang, H.
,
Chen, L.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.41 MB
Your tags:
english, 2019
2
Optical gain in laser diodes with null reflectivity
Vanzi, M.
,
Mura, G.
,
Rampulla, A.
,
Marchetti, R.
,
Sanna Valle, V.
,
Ueno, Y.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 981 KB
Your tags:
english, 2019
3
Fault resilient FPGA design for 28 nm ZYNQ system-on-chip based radiation monitoring system at CERN
Toner, C.
,
Boukabache, H.
,
Ducos, G.
,
Pangallo, M.
,
Danzeca, S.
,
Widorski, M.
,
Roesler, S.
,
Perrin, D.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.56 MB
Your tags:
english, 2019
4
A comparative study of nanostructured Silicon-Nitride electrical properties for potential application in RF-MEMS capacitive switches
Birmpiliotis, D.
,
Stavrinidis, G.
,
Koutsoureli, M.
,
Konstantinidis, G.
,
Papaioannou, G.
,
Ziaei, A.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.41 MB
Your tags:
english, 2019
5
Hardware-based approach to guarantee trusted system boot in embedded systems
Correa, Lucas
,
Vargas, Fabian
,
Poehls, Letícia
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.16 MB
Your tags:
english, 2019
6
Evaluating IGBT temperature evolution during short circuit operations using a TSEP-based method
Ceccarelli, L.
,
Wu, R.
,
Iannuzzo, F.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.39 MB
Your tags:
english, 2019
7
A closed-loop voltage prognosis for lithium-ion batteries under dynamic loads using an improved equivalent circuit model
Yang, Jie
,
Yu, Jinsong
,
Tang, Diyin
,
Dai, Jing
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.83 MB
Your tags:
english, 2019
8
A new method for small sample space components screening: Challenges, algorithms and a case-study with Microchip
Archimbaud, A.
,
Bergeret, F.
,
D'Alberto, S.
,
Bonnin, C.
,
Soual, C.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.31 MB
Your tags:
english, 2019
9
Fretting wear and reliability assessment of gold-plated electrical connectors
Xu, L.
,
Ling, S.
,
Lin, Y.
,
Li, D.
,
Wu, S.
,
Zhai, G.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.82 MB
Your tags:
english, 2019
10
Mechanism of carbon particle-induced latent leakage between metal lines
Qin, Wentao
,
Deal, Paul
,
Steinwall, Jim
,
Kabadi, Raj
,
Chang, George
,
Ruiz, Bladimiro
,
Barrientos, Denise
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.14 MB
Your tags:
english, 2019
11
Failure analysis case studies of floating nets in mixed-signal IC
Fauré, A.
,
Lombardi, T.
,
Goxe, J.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.05 MB
Your tags:
english, 2019
12
Characterization of the onset of carrier multiplication in power devices by a collimated radioactive alpha source
Ciappa, Mauro
,
Pocaterra, Marco
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.74 MB
Your tags:
english, 2019
13
Cold temperature power on reset use case
van Veenhuizen, Marc
,
Looijmans, Dirk
,
Vogels, Mari
,
van Aalten, Matthijs
,
van der Cruijsen, Peter
,
Gibas, Piotr
,
Ersoy, Selçuk
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.48 MB
Your tags:
english, 2019
14
Peak minimisation based gate delay compensation for active current balancing of parallel IGBT system
Tripathi, Ravi Nath
,
Tsukuda, M.
,
Omura, I.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.05 MB
Your tags:
english, 2019
15
A new high-voltage H2S single noxious gas reliability test for power modules
Wassermann, T.N.
,
Schilling, O.
,
Müller, K.
,
Rossin, A.
,
Uhlig, J.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.75 MB
Your tags:
english, 2019
16
Simple method for monitoring the switching activity in memristive cross-point arrays with line resistance effects
Miranda, E.
,
Morell, A.
,
Muñoz-Gorriz, J.
,
Suñé, J.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.84 MB
Your tags:
english, 2019
17
A computational study of the effect of bond pad thickness on the polysilicon piezoresistivity due to wafer level probing
Mane, Sanjay Shrirang
,
Sethu, Raj Sekar
,
Bergmann, Lars
,
Erstling, Marco
,
Soon, Kok Heng
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.29 MB
Your tags:
english, 2019
18
Terrestrial neutron-induced single events in GaN
Munteanu, D.
,
Autran, J.L.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.89 MB
Your tags:
english, 2019
19
Mitigating single event upset method for Zynq MPSoC
Cui, Xiuhai
,
Liu, Liansheng
,
Liang, Jun
,
Peng, Yu
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.09 MB
Your tags:
english, 2019
20
Characterization of charge trapping mechanisms in GaN vertical Fin FETs under positive gate bias
Ruzzarin, M.
,
De Santi, C.
,
Chiocchetta, F.
,
Sun, M.
,
Palacios, T.
,
Zanoni, E.
,
Meneghesso, G.
,
Meneghini, M.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1013 KB
Your tags:
english, 2019
21
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
De Sio, C.
,
Azimi, S.
,
Bozzoli, L.
,
Du, B.
,
Sterpone, L.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.93 MB
Your tags:
english, 2019
22
Long term accelerated ageing of an ASIC dedicated to cryptographic application
Coutet, Julien
,
Doche, Emmanuel
,
Guetard, Romain
,
Janvresse, Aurelien
,
Lavagne, Suzel
,
Lebosse, Pierre
,
Pastre, Antonin
,
Sarlotte, Michel
,
Moreau, Christian
,
Marc, François
,
Bayle, Franck
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.26 MB
Your tags:
english, 2019
23
Destruction analyses of power supplies due to electric pulse
Mejecaze, G.
,
Dubois, T.
,
Curos, L.
,
Puybaret, F.
,
Vinassa, J.-M.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.29 MB
Your tags:
english, 2019
24
Stress factors in aircraft electronics: Superimpositions, case studies and failure precautions
Jacob, P.
,
Nicoletti, G.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.22 MB
Your tags:
english, 2019
25
Influence of curvature induced stress on first principle calculation and the reliability of 4H-SiC (0001) thermally grown SiO2 gate oxide
Xu, Hengyu
,
Wan, Caiping
,
Li, Bo
,
Zhu, Huiping
,
Ao, Jin-Ping
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 506 KB
Your tags:
english, 2019
26
Effect of TLP rise time on ESD failure modes of collector-base junction of SiGe heterojunction bipolar transistors
Fleury, Clément
,
Simbürger, Werner
,
Pogany, Dionyz
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.35 MB
Your tags:
english, 2019
27
Reliability prediction model of NAND flash memory based on random forest algorithm
Wei, Debao
,
Qiao, Liyan
,
Hao, Mengqi
,
Feng, Hua
,
Peng, Xiyuan
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 3.70 MB
Your tags:
english, 2019
28
Power cycling and temperature endurance test of a GaN switching cell with substrate integrated chips
Dechant, E.
,
Seliger, N.
,
Kennel, R.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.29 MB
Your tags:
english, 2019
29
LVI-based failure analysis after PRBS defect activation: Two cases study
Marcello, G.
,
Merassi, A.
,
Medda, M.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 4.52 MB
Your tags:
english, 2019
30
Device performances and instabilities of channel engineered amorphous InGaZnO thin film transistors
Lee, Jun Hyeong
,
Park, Young Hwan
,
Shin, Joong-Won
,
Cho, Won-Ju
,
Park, Jong Tae
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.50 MB
Your tags:
english, 2019
31
Reliability investigation on CdTe solar cells submitted to short-term thermal stress
Bertoncello, Matteo
,
Barbato, Marco
,
Meneghini, Matteo
,
Artegiani, Elisa
,
Romeo, Alessandro
,
Meneghesso, Gaudenzio
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.26 MB
Your tags:
english, 2019
32
Temperature dependence of TDDB at high frequency in 28FDSOI
Arabi, M.
,
Federspiel, X.
,
Cacho, F.
,
Rafik, M.
,
Nguyen, A.-P.
,
Garros, X.
,
Ghibaudo, G.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.73 MB
Your tags:
english, 2019
33
Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions
Lindoso, A.
,
Garcia-Valderas, M.
,
Entrena, L.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 399 KB
Your tags:
english, 2019
34
Effect of HfSiON thickness on electron trap distributions of HfSiON/SiO2 nMOSFET under PBTI
Roh, Giyoun
,
Kim, Hyeokjin
,
Kwon, Youngkyu
,
Kang, Bongkoo
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.63 MB
Your tags:
english, 2019
35
Quantitative fractography analysis of a chip crack in a Si power MOSFET
Schneider, R.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.23 MB
Your tags:
english, 2019
36
Remaining useful life prediction of Lithium-ion batteries of stratospheric airship by model-based method
Xiaowei, Du
,
Guoning, Xu
,
Zhaojie, Li
,
Ying, Miao
,
Shuai, Zhao
,
Hao, Du
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 934 KB
Your tags:
english, 2019
37
Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET
Yun, Yeohyeok
,
Seo, Ji-Hoon
,
Kwon, Young-Kyu
,
Kang, Bongkoo
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.51 MB
Your tags:
english, 2019
38
Development of high-strength and superior thermal shock-resistant GaN/DBA die attach structure with Ag sinter joining by thick Ni metallization
Kim, D.
,
Chen, C.
,
Noh, S.
,
Lee, S.-J.
,
Zhang, Z.
,
Kimoto, Y.
,
Sugahara, T.
,
Suganuma, K.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.55 MB
Your tags:
english, 2019
39
Using infrared thermal responses for PCBA production tests: Feasibility study
Alaoui, Nabil El Belghiti
,
Cassou, Anaïs
,
Tounsi, Patrick
,
Boyer, Alexandre
,
Viard, Arnaud
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 2.06 MB
Your tags:
english, 2019
40
Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters
Sudo, M.
,
Nagamatsu, T.
,
Tsukuda, M.
,
Omura, I.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 3.30 MB
Your tags:
english, 2019
41
Reliability evaluation of a 0.25 μm SiGe technology for space applications
Robin, C.
,
Rochette, S.
,
Desgrez, S.
,
Muraro, J.L.
,
Langrez, D.
,
Roux, J.L.
,
Krstic, M.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 1.88 MB
Your tags:
english, 2019
42
Modeling of FinFET SRAM array reliability degradation due to electromigration
Zhang, R.
,
Yang, K.X.
,
Liu, T.Z.
,
Milor, L.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 4.17 MB
Your tags:
english, 2019
43
Development of fast short-circuit protection system for advanced IGBT
Ichiki, M.
,
Arimoto, T.
,
Abe, S.
,
Tsukuda, M.
,
Omura, I.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 4.75 MB
Your tags:
english, 2019
44
Transmission line pulse (TLP) as integrative method for the investigation of ultra-fast trapping mechanisms on high-k MIM
Merlo, L.
,
Rossetto, I.
,
Cerati, L.
,
Ghidini, G.
,
Milani, A.
,
Toia, F.
,
Piagge, R.
,
Di Biccari, L.
,
Gevinti, E.
,
Croce, G.
,
Andreini, A.
Journal:
Microelectronics Reliability
Year:
2019
Language:
english
File:
PDF, 875 KB
Your tags:
english, 2019
45
Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions
Lindoso, A.
,
Garcia-Valderas, M.
,
Entrena, L.
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 399 KB
Your tags:
2019
46
Effect of HfSiON thickness on electron trap distributions of HfSiON/SiO2 nMOSFET under PBTI
Roh, Giyoun
,
Kim, Hyeokjin
,
Kwon, Youngkyu
,
Kang, Bongkoo
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 1.63 MB
Your tags:
2019
47
Quantitative fractography analysis of a chip crack in a Si power MOSFET
Schneider, R.
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 1.23 MB
Your tags:
2019
48
Remaining useful life prediction of Lithium-ion batteries of stratospheric airship by model-based method
Xiaowei, Du
,
Guoning, Xu
,
Zhaojie, Li
,
Ying, Miao
,
Shuai, Zhao
,
Hao, Du
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 934 KB
Your tags:
2019
49
Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET
Yun, Yeohyeok
,
Seo, Ji-Hoon
,
Kwon, Young-Kyu
,
Kang, Bongkoo
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 1.51 MB
Your tags:
2019
50
Development of high-strength and superior thermal shock-resistant GaN/DBA die attach structure with Ag sinter joining by thick Ni metallization
Kim, D.
,
Chen, C.
,
Noh, S.
,
Lee, S.-J.
,
Zhang, Z.
,
Kimoto, Y.
,
Sugahara, T.
,
Suganuma, K.
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 2.55 MB
Your tags:
2019
51
Development of fast short-circuit protection system for advanced IGBT
Ichiki, M.
,
Arimoto, T.
,
Abe, S.
,
Tsukuda, M.
,
Omura, I.
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 4.75 MB
Your tags:
2019
52
Transmission line pulse (TLP) as integrative method for the investigation of ultra-fast trapping mechanisms on high-k MIM
Merlo, L.
,
Rossetto, I.
,
Cerati, L.
,
Ghidini, G.
,
Milani, A.
,
Toia, F.
,
Piagge, R.
,
Di Biccari, L.
,
Gevinti, E.
,
Croce, G.
,
Andreini, A.
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 875 KB
Your tags:
2019
53
Editorial Board
Journal:
Microelectronics Reliability
Year:
2019
File:
PDF, 41 KB
Your tags:
2019
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