Temperature dependence of TDDB at high frequency in 28FDSOI

Microelectronics Reliability 2019 / 09 Vol. 100-101

Temperature dependence of TDDB at high frequency in 28FDSOI

Arabi, M., Federspiel, X., Cacho, F., Rafik, M., Nguyen, A.-P., Garros, X., Ghibaudo, G.
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Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113422
Date:
September, 2019
File:
PDF, 2.73 MB
english, 2019
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