Effect of oxide-trapped charge on the anomalous drain...

Microelectronics Reliability 2019 / 09 Vol. 100-101

Effect of oxide-trapped charge on the anomalous drain avalanche hot carrier degradation of a SiO2 dielectric nMOSFET

Yun, Yeohyeok, Seo, Ji-Hoon, Kwon, Young-Kyu, Kang, Bongkoo
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Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113449
Date:
September, 2019
File:
PDF, 1.51 MB
english, 2019
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