Calculation of single event burnout failure rate for high...

Microelectronics Reliability 2019 / 09 Vol. 100-101

Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters

Sudo, M., Nagamatsu, T., Tsukuda, M., Omura, I.
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Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.07.001
Date:
September, 2019
File:
PDF, 3.30 MB
english, 2019
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