Reliability evaluation of a 0.25 μm SiGe technology for...

Microelectronics Reliability 2019 / 09 Vol. 100-101

Reliability evaluation of a 0.25 μm SiGe technology for space applications

Robin, C., Rochette, S., Desgrez, S., Muraro, J.L., Langrez, D., Roux, J.L., Krstic, M.
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Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113480
Date:
September, 2019
File:
PDF, 1.88 MB
english, 2019
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