Development of fast short-circuit protection system for advanced IGBT
Ichiki, M., Arimoto, T., Abe, S., Tsukuda, M., Omura, I.Volume:
100-101
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113408
Date:
September, 2019
File:
PDF, 4.75 MB
english, 2019