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Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions
Lindoso, A., Garcia-Valderas, M., Entrena, L.Volume:
100-101
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.06.038
Date:
September, 2019
File:
PDF, 399 KB
2019