Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals
Beckhoff, Burkhard, Kanngießer, BirgitVolume:
39
Year:
1995
Journal:
Advances in X-ray Analysis
DOI:
10.1154/S0376030800022515
File:
PDF, 581 KB
1995