Improvement of the Detection Sensitivity of Edxrf Trace...

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

Beckhoff, Burkhard, Kanngießer, Birgit
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Volume:
39
Year:
1995
Journal:
Advances in X-ray Analysis
DOI:
10.1154/S0376030800022515
File:
PDF, 581 KB
1995
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