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Volume 39
Main
Advances in X-ray Analysis
Volume 39
Advances in X-ray Analysis
Volume 39
1
Application of Graded Multilayer Optics in X-Ray Diffraction
Schuster, M.
,
Göbel, H.
Journal:
Advances in X-ray Analysis
Year:
1995
Language:
english
File:
PDF, 765 KB
Your tags:
english, 1995
2
Txrf-Sources-Samples and Detectors
Wobrauschek, P.
,
Kregsamer, P.
,
Ladisich, W.
,
Riede, R.
,
Streli, Christina
,
Garbe, S.
,
Haller, M.
,
Knöchel, A.
,
Radtke, M.
Journal:
Advances in X-ray Analysis
Year:
1995
Language:
english
File:
PDF, 513 KB
Your tags:
english, 1995
3
Recent Developments in Txrf of Light Elements
Streli, Christina
,
Bauer, V.
,
Wobrauschek, P.
Journal:
Advances in X-ray Analysis
Year:
1995
Language:
english
File:
PDF, 436 KB
Your tags:
english, 1995
4
Application of Graded Multilayer Optics in X-Ray Diffraction
Schuster, M.
,
Göbel, H.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 765 KB
Your tags:
1995
5
The Evolution of X-Ray Instrumentation at Rich. Seifert & Co.
Haase, A.
Journal:
Advances in X-ray Analysis
Year:
1995
Language:
english
File:
PDF, 587 KB
Your tags:
english, 1995
6
Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method
Schwartz, Kenneth B.
,
Von Dreele, Robert B.
Journal:
Advances in X-ray Analysis
Year:
1995
Language:
english
File:
PDF, 425 KB
Your tags:
english, 1995
7
Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals
Beckhoff, Burkhard
,
Kanngießer, Birgit
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 581 KB
Your tags:
1995
8
Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method
Schwartz, Kenneth B.
,
Von Dreele, Robert B.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 425 KB
Your tags:
1995
9
Software for Comparative Analysis of Diffraction-Line Broadening
Balzar, Davor
,
Ledbetter, Hassel
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 406 KB
Your tags:
1995
10
X-Ray Characterization of Phase Equilibria of the Raveau and 2212 Phases in the Bi-Sr-Ca-Cu-0 System
Wong-Ng, Winnie
,
Cook, Lawrence P.
,
Jiang, F.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 367 KB
Your tags:
1995
11
The Early Years of X-Ray Diffraction and X-Ray Spectrometry
de Vries, J. L.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 811 KB
Your tags:
1995
12
Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples
Valvoda, V.
,
Rafaja, D.
,
Jenkins, R.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 334 KB
Your tags:
1995
13
Actual Tasks of Stress Analysis by Diffraction
Hauk, Viktor
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 594 KB
Your tags:
1995
14
Analysis of Residual Stress States in Coarse Grained and Single Crystal Nickel-Base Superalloys
Reimers, W.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 542 KB
Your tags:
1995
15
Internal Stress in an Alumina/Silicon Carbide Whisker Composite
Oden, M.
,
Ericsson, T.
,
Cohen, J. B.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 689 KB
Your tags:
1995
16
X-Ray Quantitative Analysis of Transformed Martensite in Austentic Stainless Steel
Yajima, Zenjiro
,
Kishi, Yoichi
,
Hirose, Yukio
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 275 KB
Your tags:
1995
17
The Excitation of Low Z Elements by Means of a Cylindrical Graded Multilayer as a High Energy Cut-Off in Edxrf Analysis
KanngieÃer, B.
,
Beckhoff, B.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 349 KB
Your tags:
1995
18
Techniques for the Determination of Particle Size and Texture in Retained Austenite / Martensite Microstructures and Interpretation of the Measurements
Makinson, J. D.
,
Weins, W. N.
,
Xu, Y.
,
Medlin, D. J.
,
Lawrence, R. V.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 386 KB
Your tags:
1995
19
100 Years of Progress in X-Ray Fluorescence Analysis
Gilfrich, John V.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 583 KB
Your tags:
1995
20
Characterization Of Single Crystal Epitaxial Aluminum Nitride Thin Films On Sapphire, Silicon Carbide And Silicon Substrates By X-Ray Double Crystal Diffractometry And Transmission Electron Microscopy
Chaudhuri, J.
,
Thokala, R.
,
Edgar, J. H.
,
Sywe, B. S.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 595 KB
Your tags:
1995
21
New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners
Stabenow, Rainer
,
Haase, Alfried
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 314 KB
Your tags:
1995
22
Evolution of X-Ray Instrumentation & Techniques, 1970-1990
Jenkins, Ron
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 476 KB
Your tags:
1995
23
Accurate Measurement of Lattice Misfit Between γ And γ' Phases in Nickel-Base Superalloys at High Temperatures
Yokokawa, Tadaharu
,
Ohno, Katsumi
,
Murakami, Hideyuki
,
Kobayashi, Toshiharu
,
Yamagata, Toshihiro
,
Harada, Hiroshi
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 347 KB
Your tags:
1995
24
Oxide Scale Stresses in Polycrystalune Cu/Cu 2 O System
Jayaraman, N.
,
Rangaswamy, Partha
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 490 KB
Your tags:
1995
25
Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al 2 O 3 /SiC(w) Composite
Zhu, X.
,
Predecki, P.
,
Eatough, M.
,
Goebner, R.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 502 KB
Your tags:
1995
26
X-Ray Stress Measurement of Hexagonal Polycrystals with [001] Fiber Texture
Tanaka, Keisuke
,
Ishihara, Keisaku
,
Akiniwa, Yoshiaki
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 164 KB
Your tags:
1995
27
New Rotating Anode X-Ray Generator For XAFS Experiments
Sakurai, Kenji
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 252 KB
Your tags:
1995
28
X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films
Vermeulen, A. C.
,
Delhez, R.
,
de Keijser, Th.H.
,
Mittemeijer, E. J.
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 693 KB
Your tags:
1995
29
The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe
Spolnik, Zoya
,
Lawniczak-Jablonska, Krystyna
Journal:
Advances in X-ray Analysis
Year:
1995
File:
PDF, 248 KB
Your tags:
1995
1
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