Volume 39

Advances in X-ray Analysis

Volume 39

1

Application of Graded Multilayer Optics in X-Ray Diffraction

Schuster, M., Göbel, H.

Journal:

Advances in X-ray Analysis

Year:

1995

Language:

english

File:

PDF, 765 KB

english, 1995

2

Txrf-Sources-Samples and Detectors

Wobrauschek, P., Kregsamer, P., Ladisich, W., Riede, R., Streli, Christina, Garbe, S., Haller, M., Knöchel, A., Radtke, M.

Journal:

Advances in X-ray Analysis

Year:

1995

Language:

english

File:

PDF, 513 KB

english, 1995

3

Recent Developments in Txrf of Light Elements

Streli, Christina, Bauer, V., Wobrauschek, P.

Journal:

Advances in X-ray Analysis

Year:

1995

Language:

english

File:

PDF, 436 KB

english, 1995

4

Application of Graded Multilayer Optics in X-Ray Diffraction

Schuster, M., Göbel, H.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 765 KB

1995

5

The Evolution of X-Ray Instrumentation at Rich. Seifert & Co.

Journal:

Advances in X-ray Analysis

Year:

1995

Language:

english

File:

PDF, 587 KB

english, 1995

6

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

Schwartz, Kenneth B., Von Dreele, Robert B.

Journal:

Advances in X-ray Analysis

Year:

1995

Language:

english

File:

PDF, 425 KB

english, 1995

7

Improvement of the Detection Sensitivity of Edxrf Trace Element Analysis by Means of Efficient X-Ray Focusing Based on Strongly Curved Hopg Crystals

Beckhoff, Burkhard, Kanngießer, Birgit

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 581 KB

1995

8

Structure Refinement of High-Density Polyethylene Using X-Ray Powder Diffraction Data and the Rietveld Method

Schwartz, Kenneth B., Von Dreele, Robert B.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 425 KB

1995

9

Software for Comparative Analysis of Diffraction-Line Broadening

Balzar, Davor, Ledbetter, Hassel

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 406 KB

1995

10

X-Ray Characterization of Phase Equilibria of the Raveau and 2212 Phases in the Bi-Sr-Ca-Cu-0 System

Wong-Ng, Winnie, Cook, Lawrence P., Jiang, F.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 367 KB

1995

11

The Early Years of X-Ray Diffraction and X-Ray Spectrometry

de Vries, J. L.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 811 KB

1995

12

Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples

Valvoda, V., Rafaja, D., Jenkins, R.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 334 KB

1995

13

Actual Tasks of Stress Analysis by Diffraction

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 594 KB

1995

14

Analysis of Residual Stress States in Coarse Grained and Single Crystal Nickel-Base Superalloys

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 542 KB

1995

15

Internal Stress in an Alumina/Silicon Carbide Whisker Composite

Oden, M., Ericsson, T., Cohen, J. B.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 689 KB

1995

16

X-Ray Quantitative Analysis of Transformed Martensite in Austentic Stainless Steel

Yajima, Zenjiro, Kishi, Yoichi, Hirose, Yukio

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 275 KB

1995

17

The Excitation of Low Z Elements by Means of a Cylindrical Graded Multilayer as a High Energy Cut-Off in Edxrf Analysis

KanngieÃer, B., Beckhoff, B.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 349 KB

1995

18

Techniques for the Determination of Particle Size and Texture in Retained Austenite / Martensite Microstructures and Interpretation of the Measurements

Makinson, J. D., Weins, W. N., Xu, Y., Medlin, D. J., Lawrence, R. V.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 386 KB

1995

19

100 Years of Progress in X-Ray Fluorescence Analysis

Gilfrich, John V.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 583 KB

1995

20

Characterization Of Single Crystal Epitaxial Aluminum Nitride Thin Films On Sapphire, Silicon Carbide And Silicon Substrates By X-Ray Double Crystal Diffractometry And Transmission Electron Microscopy

Chaudhuri, J., Thokala, R., Edgar, J. H., Sywe, B. S.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 595 KB

1995

21

New Tools for Grazing Incidence Diffraction Measurements: Comparison of Different Primary and Secondary Beam Conditioners

Stabenow, Rainer, Haase, Alfried

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 314 KB

1995

22

Evolution of X-Ray Instrumentation & Techniques, 1970-1990

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 476 KB

1995

23

Accurate Measurement of Lattice Misfit Between Î³ And Î³' Phases in Nickel-Base Superalloys at High Temperatures

Yokokawa, Tadaharu, Ohno, Katsumi, Murakami, Hideyuki, Kobayashi, Toshiharu, Yamagata, Toshihiro, Harada, Hiroshi

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 347 KB

1995

24

Oxide Scale Stresses in Polycrystalune Cu/Cu 2 O System

Jayaraman, N., Rangaswamy, Partha

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 490 KB

1995

25

Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al 2 O 3 /SiC(w) Composite

Zhu, X., Predecki, P., Eatough, M., Goebner, R.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 502 KB

1995

26

X-Ray Stress Measurement of Hexagonal Polycrystals with [001] Fiber Texture

Tanaka, Keisuke, Ishihara, Keisaku, Akiniwa, Yoshiaki

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 164 KB

1995

27

New Rotating Anode X-Ray Generator For XAFS Experiments

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 252 KB

1995

28

X-Ray Diffraction Analysis of Simultaneous Changes in Stress and Dislocation Densities in Thin Films

Vermeulen, A. C., Delhez, R., de Keijser, Th.H., Mittemeijer, E. J.

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 693 KB

1995

29

The Study of the Electronic Structure of ZnS Doped With Co by Electron Microprobe

Spolnik, Zoya, Lawniczak-Jablonska, Krystyna

Journal:

Advances in X-ray Analysis

Year:

1995

File:

PDF, 248 KB

1995