Impact of Annealing on the Resistivity of Ultrafine Cu Damascene Interconnects
Steinlesberger, G., Engelhardt, M., Schindler, G., Steinhögl, W., Traving, M., Hönlein, W., Bertagnolli, E.Volume:
766
Year:
2003
Journal:
MRS Proceedings
DOI:
10.1557/PROC-766-E4.2
File:
PDF, 1.00 MB
2003